Document Type

Journal Article

Publisher

IEEE

Faculty

Computing, Health and Science

School

Electron Science Research Institute

RAS ID

4666

Comments

This article was originally published as: Aljada, M., Alameh, K., Lee, B., Lee, Y. T., Im, K., & Baik, S. (2007). Experimental demonstration of a dynamic 10Gbit/s WDM header/label recognition structure. IEEE Journal of Selected Topics in Quantum Electronics, 13(5), 1560-1566. Original article available here

© 2007 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Abstract

In this paper, we experimentally demonstrate a dynamic wavelength-division-multiplexing (WDM) header/label recognition structure that processes on-the-fly WDM patterns. An opto-VLSI processor is used to dynamically generate digital phase holograms that control the wavelength components of the label/header to create digital wavelength profiles. An autocorrelation function of a high-peak is generated when a label bit pattern matches a digital wavelength profile. The main attractive feature of using an opto-VLSI processor is that the lookup table of matching digital wavelength profiles does not need modification when the data bit-rate is upgraded. The dynamic pattern recognition structure is experimentally demonstrated at 10 Gbit/s for 4-, 6-, and 8-bit labels.

DOI

10.1109/JSTQE.2007.902649

Access Rights

free_to_read

 
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Link to publisher version (DOI)

10.1109/JSTQE.2007.902649