Document Type

Journal Article

Publisher

IEEE

Faculty

Computing, Health and Science

School

Electron Science Research Institute

RAS ID

4666

Comments

This article was originally published as: Aljada, M., Alameh, K., Lee, B., Lee, Y. T., Im, K., & Baik, S. (2007). Experimental demonstration of a dynamic 10Gbit/s WDM header/label recognition structure. IEEE Journal of Selected Topics in Quantum Electronics, 13(5), 1560-1566. Original article available here

Abstract

In this paper, we experimentally demonstrate a dynamic wavelength-division-multiplexing (WDM) header/label recognition structure that processes on-the-fly WDM patterns. An opto-VLSI processor is used to dynamically generate digital phase holograms that control the wavelength components of the label/header to create digital wavelength profiles. An autocorrelation function of a high-peak is generated when a label bit pattern matches a digital wavelength profile. The main attractive feature of using an opto-VLSI processor is that the lookup table of matching digital wavelength profiles does not need modification when the data bit-rate is upgraded. The dynamic pattern recognition structure is experimentally demonstrated at 10 Gbit/s for 4-, 6-, and 8-bit labels.

DOI

10.1109/JSTQE.2007.902649

 
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Link to publisher version (DOI)

10.1109/JSTQE.2007.902649