Document Type

Conference Proceeding

Publisher

IEEE Computer Society

Faculty

Computing, Health and Science

School

Electron Science Research Institute

RAS ID

5170

Comments

This conference paper was originally published as: Aljada, M. , Osseiran, A. , & Alameh, K. (2006). Catastrophic and Parametric Fault Modelling for Photonic Systems. Proceedings of Third IEEE International Workshop on Electronic Design, Test and Applications, 2006. DELTA 2006. (pp. 4). Malaysia. IEEE Computer Society. Original article available here

Abstract

In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.

DOI

10.1109/DELTA.2006.21

Included in

Engineering Commons

 
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Link to publisher version (DOI)

10.1109/DELTA.2006.21