Document Type

Conference Proceeding

Publisher

IEEE Computer Society

Faculty

Computing, Health and Science

School

Electron Science Research Institute

RAS ID

5170

Comments

This conference paper was originally published as: Aljada, M. , Osseiran, A. , & Alameh, K. (2006). Catastrophic and Parametric Fault Modelling for Photonic Systems. Proceedings of Third IEEE International Workshop on Electronic Design, Test and Applications, 2006. DELTA 2006. (pp. 4). Malaysia. IEEE Computer Society. Original article available here

© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Abstract

In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.

DOI

10.1109/DELTA.2006.21

Access Rights

free_to_read

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Link to publisher version (DOI)

10.1109/DELTA.2006.21