Document Type
Conference Proceeding
Publisher
IEEE Computer Society
Faculty
Computing, Health and Science
School
Electron Science Research Institute
RAS ID
5170
Abstract
In this paper, we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.
Comments
This conference paper was originally published as: Aljada, M. , Osseiran, A. , & Alameh, K. (2006). Catastrophic and Parametric Fault Modelling for Photonic Systems. Proceedings of Third IEEE International Workshop on Electronic Design, Test and Applications, 2006. DELTA 2006. (pp. 4). Malaysia. IEEE Computer Society. Original article available here