Document Type

Conference Proceeding

Publisher

IFIP (International Federation for Information Processing)

Faculty

Computing, Health and Science

School

Electron Science Research Institute

RAS ID

3591

Comments

This article was originally published as: Aljada, M. , Osseiran, A. , & Alameh, K. (2005). Parametric Fault Modelling for Photonics System. Proceedings of IFIP VLSI-SoC 2005. (pp. 447-450). Perth. IFIP (International Federation for Information Processing). Original article available here.

Abstract

In this paper we investigate the impact of the most probable parametric faults generated by mal-functioning components in phonetic systems. We demonstrate, using the example of a MicroPholonic header correlator, the effectiveness of mixed-signals testing techniques for fault detection in photonic systems.

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