Document Type
Conference Proceeding
Publisher
IFIP (International Federation for Information Processing)
Faculty
Computing, Health and Science
School
Electron Science Research Institute
RAS ID
3591
Abstract
In this paper we investigate the impact of the most probable parametric faults generated by mal-functioning components in phonetic systems. We demonstrate, using the example of a MicroPholonic header correlator, the effectiveness of mixed-signals testing techniques for fault detection in photonic systems.
Comments
This article was originally published as: Aljada, M. , Osseiran, A. , & Alameh, K. (2005). Parametric Fault Modelling for Photonics System. Proceedings of IFIP VLSI-SoC 2005. (pp. 447-450). Perth. IFIP (International Federation for Information Processing).