Document Type

Conference Proceeding

Publisher

Engineers Australia

Faculty

Faculty of Computing, Health and Science

School

School of Engineering / Centre for Communications Engineering Research

RAS ID

14766

Comments

This article was originally published as: Barr, J. A., Jansz, P. V., Hinckley, S. , & WILD, G. (2012). Low-Cost Educational Optical Coherence Tomography System for Thickness MeasurmentsTomography System for Thickness Measurments. Proceedings of 20th Australian Institute of Physics Congress. (pp. 1-4). Sydney, Australia. Engineers Australia. Conference website available here.

Abstract

We have developed an inexpensive rudimentary low coherence interferometer that can be used to measure sample thickness in the micron to mm range, and for exploring educational aspects of interferometry and optical coherence tomography.

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