Title

Magneto-optical methods for analysis of nanothick magnetodielectric films

Document Type

Journal Article

Publisher

Springer

School

Electronics Engineering and ICT Research Center

RAS ID

23418

Comments

Originally published as :

Balabanov, D. E., Kotov, V. A., Shavrov, V. G., Vasiliev, M., & Alameh, K. (2017). Magneto-optical methods for analysis of nanothick magnetodielectric films. Journal of Communications Technology and Electronics, 62(1), 78-82. Original article available here Original Russian Text © D.E. Balabanov, V.A. Kotov, V.G. Shavrov, M. Vasiliev, K. Alameh, 2017, published in Radiotekhnika i Elektronika, 2017, Vol. 62, No. 1, pp. 70–74.

Abstract

An original design of a compensation magnetic system is suggested and implemented: it enables one to measure the difference signal by placing in the measuring device a film on a paramagnetic device and the original paramagnetic substrate, thereby providing the full compensation of the paramagnetic substrate.

DOI

10.1134/S106422691701003X