Title

Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb:YAG amplifiers of hundred-mJ-level

Document Type

Journal Article

Publisher

Springer Verlag

Place of Publication

Germany

School

Electron Science Research Institute

Comments

Originally published as: Lang, Y., Xin, J., Alameh, K., Fan, Z., Chen, Y., Ge, W., ... & Liao, L. (2017). Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb: YAG amplifiers of hundred-mJ-level. Applied Physics B, 123(9), 231. Available here.

Abstract

The transient thermal distribution and thermally induced beam quality (M2) degradation in low repetition (10 Hz) and hundred-mJ-level end-pumped Yb:YAG slab amplifiers with different thicknesses are discussed. Using Fast Fourier Transformation, the output beam quality is evaluated for different pump conditions, including variable pump power, single- or double-end pumping, and different pump beam widths. Simulation results show that for a slab amplifier operating at low repetition rates and high pump energy levels, adequate thermal property and output beam quality can be achieved by simply increasing the slab thickness.

DOI

10.1007/s00340-017-6807-7

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