Measurements of Luminescence from Ceaved Silicon
This article was originally published: Proceedings of European Nano Systems, Paris France 2005 ENS 2005) ; including 1st Workshop on Nano Technology Transfer in Europe ; 14 - 16 December 2005, Paris, France. Grenoble : TIMA Ed., 2005. ISBN 9782916187020 Original article available here
This paper outlines the results from experiments performed to gain further information about the structure and properties of cleaved silicon surfaces, using vacuum cleavage luminescence detection methods. The experiments involved detecting the luminescence produced by cleaving thin silicon plates within a high vacuum, by a process of converting the luminescence to an amplified electrical signal.