Document Type
Conference Proceeding
Publisher
IEEE
Faculty
Faculty of Computing, Health and Science
School
School of Engineering / Centre for Communications Engineering Research
RAS ID
14773
Abstract
Simulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, so that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels.
DOI
10.1109/COMMAD.2012.6472435
Access Rights
free_to_read
Comments
This is an Author's Accepted Manuscript of: Jansz, P. V., & Hinckley, S. (2012). Enhanced UV-Blue Response of Back Illuminated Deep Double Junction CMOS Compatible Photodiode Pixels; a Simulation Study of High Resolution Pixel Arrays. Proceedings of 2012 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD). (pp. 211-212). Melbourne, Australia. IEEE. Available here
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