Document Type

Conference Proceeding

Publisher

IEEE

Faculty

Faculty of Computing, Health and Science

School

School of Engineering / Centre for Communications Engineering Research

RAS ID

14773

Comments

This article was originally published as: Jansz, P. V., & Hinckley, S. (2012). Enhanced UV-Blue Response of Back Illuminated Deep Double Junction CMOS Compatible Photodiode Pixels; a Simulation Study of High Resolution Pixel Arrays. Proceedings of 2012 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD). (pp. 211-212). Melbourne, Australia. IEEE. Original article available here

© 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Abstract

Simulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, so that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels.

DOI

10.1109/COMMAD.2012.6472435

Access Rights

free_to_read

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Engineering Commons

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