Faculty of Computing, Health and Science
Electron Science Research Institute (ESRI)
In this paper, we experimentally demonstrate a dynamic wavelength-division-multiplexing (WDM) header/label recognition structure that processes on-the-fly WDM patterns. An opto-VLSI processor is used to dynamically generate digital phase holograms that control the wavelength components of the label/header to create digital wavelength profiles. An autocorrelation function of a high-peak is generated when a label bit pattern matches a digital wavelength profile. The main attractive feature of using an opto-VLSI processor is that the lookup table of matching digital wavelength profiles does not need modification when the data bit-rate is upgraded. The dynamic pattern recognition structure is experimentally demonstrated at 10 Gbit/s for 4-, 6-, and 8-bit labels.