Title

Characterization of surface contact-induced fracture in ceramics using a focused ion beam miller

Document Type

Journal Article

Faculty

Faculty of Computing, Health and Science

School

School of Engineering

RAS ID

8918

Comments

Xie, Z. H., Munroe, P. R., Moon, R. J., & Hoffman, M. (2003). Characterization of surface contact-induced fracture in ceramics using a focused ion beam miller. Wear, 255(1-6), 651-656.

Abstract

Focused ion beam (FIB) milling and imaging are powerful techniques for evaluation of surface contact-induced crack structures and the effect of microstructure on crack growth in ceramics. Two distinct α-sialon microstructures made from the same composition were tested under indentation, scratching and grinding conditions. Following each test, the FIB was used to analyze fracture events in both the surface and subsurface, and reveal the factors that control material removal during surface contact.

DOI

10.1016/S0043-1648(03)00043-7

 
COinS
 

Link to publisher version (DOI)

10.1016/S0043-1648(03)00043-7