Title

Application of focused ion beam miller in fracture characterization

Document Type

Journal Article

Faculty

Faculty of Computing, Health and Science

School

School of Engineering

RAS ID

8914

Comments

Xie, Z. H., Munroe, P. R., Hoffman, M., Moon, R. J., & Cheng, Y. B. (2003). Application of focused ion beam miller in fracture characterization. Key Engineering Materials, 247, 297-300.

Abstract

Focused ion beam (FIB) miller is a new tool used for the examination of micro-fracture in ceramics. In this work, a FIB miller was employed to investigate fracture events involved in effect of microstructure on cracking were revealed.

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