Document Type
Conference Proceeding
Publisher
Engineers Australia
Faculty
Faculty of Computing, Health and Science
School
School of Engineering / Centre for Communications Engineering Research
RAS ID
14766
Abstract
We have developed an inexpensive rudimentary low coherence interferometer that can be used to measure sample thickness in the micron to mm range, and for exploring educational aspects of interferometry and optical coherence tomography.
Access Rights
free_to_read
Comments
Barr, J. A., Jansz, P. V., Hinckley, S. , & WILD, G. (2012). Low-Cost Educational Optical Coherence Tomography System for Thickness MeasurmentsTomography System for Thickness Measurments. Proceedings of 20th Australian Institute of Physics Congress. (pp. 1-4). Sydney, Australia. Engineers Australia. Conference website available here.