Abstract

Copper doping in zinc telluride (ZnTe) thin films has been extensively studied for optoelectronic applications; however, challenges remain in optimizing temperature-dependent diffusion while minimizing defect-related emissions. Although numerous studies have explored Cu-doped ZnTe, comprehensive investigations using electron-beam (E-beam) evaporation remain limited, especially concerning its influence on diffusion dynamics, defect formation, and electrical properties. This study systematically examined Cu-doped ZnTe films fabricated via E-beam evaporation with a fixed 50 nm Cu layer deposited at three substrate temperatures (RT, 150 °C, and 300 °C), followed by rapid thermal annealing (RTA) at 100 °C and 200 °C for 1 h under a nitrogen atmosphere. An as-cast (non-annealed) sample was also analyzed as a baseline reference. By investigating the interplay between deposition and annealing temperatures, this work provided new insights into temperature-driven diffusion control mechanisms and their influence on the structural, morphological, and electrical properties of ZnTe: Cu films. The optimal sample (ZT-Cu_150_A200) exhibited a carrier concentration of 1.33 × 1020 cm−3, a resistivity of 3.77 × 10−5 Ω cm, and a mobility of 1.68 × 103 cm2/V·s, significantly improving electrical conductivity while minimizing defect-related losses. These findings establish a crucial correlation between thermal activation, Cu diffusion dynamics, and defect passivation, offering a refined approach for optimizing Cu-doped ZnTe thin films for enhanced electronic performance.

RAS ID

83439

Document Type

Journal Article

Date of Publication

9-1-2025

Volume

10

Issue

3

Funding Information

Ministry of Higher Education of Malaysia (JPT.S(BPKI)2000/016/018/015JId.4(21)/2022003HICOE)

School

School of Science

Creative Commons License

Creative Commons Attribution 4.0 License
This work is licensed under a Creative Commons Attribution 4.0 License.

Publisher

Elsevier

Identifier

Mohammad Nur-E-Alam: https://orcid.org/0000-0003-1969-3348

Comments

Salah, S., Doroody, C., Za’abar, F. ‘., Feng, Z., Krishnan, P. S., Zuhdi, A. W. M., Harif, M. N., Ahmad, N. I., Kar, Y. B., & Nur-E-Alam, M. (2025). Temperature-dependent properties of CU-doped ZnTe thin films deposited on SLG substrates via RF magnetron sputtering and E-beam techniques. Journal of Science Advanced Materials and Devices, 10(3), 100944. https://doi.org/10.1016/j.jsamd.2025.100944

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