Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb:YAG amplifiers of hundred-mJ-level
Abstract
The transient thermal distribution and thermally induced beam quality (M2) degradation in low repetition (10 Hz) and hundred-mJ-level end-pumped Yb:YAG slab amplifiers with different thicknesses are discussed. Using Fast Fourier Transformation, the output beam quality is evaluated for different pump conditions, including variable pump power, single- or double-end pumping, and different pump beam widths. Simulation results show that for a slab amplifier operating at low repetition rates and high pump energy levels, adequate thermal property and output beam quality can be achieved by simply increasing the slab thickness.
Document Type
Journal Article
Location of the Work
Germany
School
Electron Science Research Institute
RAS ID
26961
Copyright
subscription content
Publisher
Springer Verlag
Comments
Lang, Y., Xin, J., Alameh, K., Fan, Z., Chen, Y., Ge, W., . . . Liao, L. (2017). Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb: YAG amplifiers of hundred-mJ-level. Applied Physics B, 123(9), article 231. https://doi.org/10.1007/s00340-017-6807-7