Title

Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb:YAG amplifiers of hundred-mJ-level

Document Type

Journal Article

Publisher

Springer Verlag

Place of Publication

Germany

School

Electron Science Research Institute

RAS ID

26961

Comments

Lang, Y., Xin, J., Alameh, K., Fan, Z., Chen, Y., Ge, W., ... & Liao, L. (2017). Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb: YAG amplifiers of hundred-mJ-level. Applied Physics B, 123(9), 231. Available here.

Abstract

The transient thermal distribution and thermally induced beam quality (M2) degradation in low repetition (10 Hz) and hundred-mJ-level end-pumped Yb:YAG slab amplifiers with different thicknesses are discussed. Using Fast Fourier Transformation, the output beam quality is evaluated for different pump conditions, including variable pump power, single- or double-end pumping, and different pump beam widths. Simulation results show that for a slab amplifier operating at low repetition rates and high pump energy levels, adequate thermal property and output beam quality can be achieved by simply increasing the slab thickness.

DOI

10.1007/s00340-017-6807-7

Share

 
COinS