Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb:YAG amplifiers of hundred-mJ-level
Place of Publication
Electron Science Research Institute
The transient thermal distribution and thermally induced beam quality (M2) degradation in low repetition (10 Hz) and hundred-mJ-level end-pumped Yb:YAG slab amplifiers with different thicknesses are discussed. Using Fast Fourier Transformation, the output beam quality is evaluated for different pump conditions, including variable pump power, single- or double-end pumping, and different pump beam widths. Simulation results show that for a slab amplifier operating at low repetition rates and high pump energy levels, adequate thermal property and output beam quality can be achieved by simply increasing the slab thickness.