Author Identifier

Saman Akbarzadeh
ORCID: 0000-0003-4293-1797

Document Type

Journal Article

Publication Title

Computers and Electronics in Agriculture

Publisher

Elsevier

Place of Publication

Netherlands

School

Electron Science Research Institute

RAS ID

28124

Comments

Akbarzadeh, S., Paap, A., Ahderom, S., Apopei, B., & Alameh, K. (2018). Plant discrimination by Support Vector Machine classifier based on spectral reflectance. Computers and Electronics in Agriculture, 148, 250-258. Available here.

This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/

Abstract

Support Vector Machine (SVM) algorithms are developed for weed-crop discrimination and their accuracies are compared with a conventional data-aggregation method based on the evaluation of discrete Normalised Difference Vegetation Indices (NDVIs) at two different wavelengths. A testbed is especially built to collect the spectral reflectance properties of corn (as a crop) and silver beet (as a weed) at 635 nm, 685 nm, and 785 nm, at a speed of 7.2 km/h. Results show that the use of the Gaussian-kernel SVM method, in conjunction with either raw reflected intensities or NDVI values as inputs, provides better discrimination accuracy than that attained using the discrete NDVI-based aggregation algorithm. Experimental results carried out in laboratory conditions demonstrate that the developed Gaussian SVM algorithms can classify corn and silver beet with corn/silver-beet discrimination accuracies of 97%, whereas the maximum accuracy attained using the conventional NDVI-based method does not exceed 70%.

DOI

10.1016/j.compag.2018.03.026

Creative Commons License

Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License.

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